Teradyne today announced the release of its UltraPHY 224G instrument, designed for the UltraFLEXplus platform. The new test system delivers bench‑quality signal generation and measurement for production testing of next‑generation semiconductor interfaces. It is the first UltraPHY instrument to support data rates up to 112 Gb/s NRZ and 224 Gb/s PAM4 using a DSO + BERT architecture.
The UltraPHY 224G features eight full‑duplex differential lanes and eight Rx‑only differential lanes per instrument, providing eight full‑duplex lanes plus eight Rx‑only lanes. It supports data rates up to 112 Gb/s NRZ and 224 Gb/s PAM4, and is scalable to multiple instruments per UltraFLEXplus platform. The system is engineered to meet strict hardware and software standards, setting a new benchmark for test density and signal fidelity required by next‑generation semiconductor interfaces.
By extending its portfolio beyond the existing UltraPHY 112G, Teradyne’s new instrument addresses emerging data‑center and silicon‑photonics markets. The UltraPHY 224G enables customers to test the broadest range of current and future high‑speed interfaces on a single test platform, supporting chiplet‑based architectures, advanced packaging, and KGD workflows. This launch strengthens Teradyne’s position in the high‑growth semiconductor test market and enhances its competitive advantage in delivering future‑proof testing solutions.
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